General trace and log analysis patterns allow application of uniform problem detection and solving approach across diverse software environments. This pattern language covers any execution artifact from a small debugging trace to a distributed log with billions of messages from hundreds of computers, thousands of software components, threads, and processes. Pattern-oriented trace and log analysis is applicable to troubleshooting and debugging Windows, Mac OS X, Linux, FreeBSD, Android, iOS, z/OS, and any other possible computer platform including networking and IoT. Its pattern catalog is a part of pattern-oriented software diagnostics, forensics, prognostics, root cause analysis, and debugging developed by Software Diagnostics Institute. This reference reprints with corrections 133 patterns originally published in Memory Dump Analysis Anthology volumes 3 - 9 and Software Diagnostics Library. Full-color diagrams accompany most pattern descriptions. The second edition includes 33 more patterns and improved pattern index.
- Title: Software Trace and Log Analysis: A Pattern Reference
- Authors: Dmitry Vostokov, Software Diagnostics Institute
- Language: English
- Product Dimensions: 21.6 x 14.0
- Paperback: 224 pages
- Publisher: OpenTask; 2 edition (November 2016)
- ISBN-13: 978-1-908043825